Layout and first results of the nanotomography endstation at the P05 beamline at PETRA III

被引:2
作者
Ogurreck, M. [1 ]
Greving, I. [1 ]
Marschall, F. [2 ]
Vogt, H. [2 ]
Last, A. [2 ]
do Rosario, J. J. [3 ]
Leib, E. W. [4 ]
Beckmann, F. [1 ]
Wilde, F. [1 ]
Mueller, M. [1 ]
机构
[1] Helmholtz Zentrum Geesthacht, Inst Mat Res, D-21502 Geesthacht, Germany
[2] Karlsruhe Inst Technol, Inst Microstruct Technol, D-76021 Karlsruhe, Germany
[3] Tech Univ Hamburg, Inst Adv Ceram, Hamburg, Germany
[4] Univ Hamburg, Inst Phys Chem, Hamburg, Germany
来源
XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2016年 / 1696卷
关键词
nanotomography; X-ray microscopy; X-ray optics; SYNCHROTRON-RADIATION; RAY; LENSES;
D O I
10.1063/1.4937502
中图分类号
TH742 [显微镜];
学科分类号
摘要
The Helmholtz-Zentrum Geesthacht operates the P05 Imaging Beamline at the DESY storage ring PETRA III. This beamline is dedicated to micro-and nanotomography with two endstations. This paper will present the nanotomography endstation layout and first results obtained from commissioning and test experiments. First tests have been performed with CRLs as X-ray objectives and newly developed rolled X-ray prism lenses as condenser optics. This setup allows a resolution of 100nm half period with an effective detector pixel size of 15nm. A first tomograph of a photonic glass sample was measured in early 2014.
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页数:5
相关论文
共 16 条
[1]   Facile Deposition of YSZ-Inverse Photonic Glass Films [J].
do Rosario, Jefferson J. ;
Dyachenko, Pavel N. ;
Kubrin, Roman ;
Pasquarelli, Robert M. ;
Petrov, Alexander Yu. ;
Eich, Manfred ;
Schneider, Gerold A. .
ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (15) :12335-12345
[2]   P05 Imaging Beam line at Petra III - First Results [J].
Greving, Imke ;
Wilde, Fabian ;
Ogurreck, Malte ;
Herzen, Julia ;
Hammel, Joerg U. ;
Hipp, Alexander ;
Friedrich, Frank ;
Lottermoser, Lars ;
Dose, Thomas ;
Burmester, Hilmar ;
Mueller, Martin ;
Beckmann, Felix .
DEVELOPMENTS IN X-RAY TOMOGRAPHY IX, 2014, 9212
[3]   OPTIMUM ENERGIES FOR X-RAY TRANSMISSION TOMOGRAPHY OF SMALL SAMPLES - APPLICATIONS OF SYNCHROTRON RADIATION TO COMPUTERIZED-TOMOGRAPHY .1. [J].
GRODZINS, L .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 206 (03) :541-545
[4]   Micro and Nano Tomography at the GKSS Imaging Beamline at PETRA III [J].
Haibel, A. ;
Ogurreck, M. ;
Beckmann, F. ;
Dose, T. ;
Wilde, F. ;
Herzen, J. ;
Mueller, M. ;
Schreyer, A. ;
Nazmov, V. ;
Simon, M. ;
Last, A. ;
Mohr, J. .
DEVELOPMENTS IN X-RAY TOMOGRAPHY VII, 2010, 7804
[5]   Latest developments in microtomography and nanotomography at PETRA III [J].
Haibel, A. ;
Beckmann, F. ;
Dose, T. ;
Herzen, J. ;
Ogurreck, M. ;
Mueller, M. ;
Schreyer, A. .
POWDER DIFFRACTION, 2010, 25 (02) :161-164
[6]   Synthesis and thermal stability of zirconia and yttria-stabilized zirconia microspheres [J].
Leib, Elisabeth W. ;
Vainio, Ulla ;
Pasquarelli, Robert M. ;
Kus, Jonas ;
Czaschke, Christian ;
Walter, Nils ;
Janssen, Rolf ;
Mueller, Martin ;
Schreyer, Andreas ;
Weller, Horst ;
Vossmeyer, Tobias .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2015, 448 :582-592
[7]   X-ray Full Field Microscopy at 30 keV [J].
Marschall, F. ;
Last, A. ;
Simon, M. ;
Kluge, M. ;
Nazmov, V. ;
Vogt, H. ;
Ogurreck, M. ;
Greving, I. ;
Mohr, J. .
22ND INTERNATIONAL CONGRESS ON X-RAY OPTICS AND MICROANALYSIS, 2014, 499
[8]  
Marschall F., 2014, THESIS KARLSRUHER I
[9]   Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility [J].
Martinez-Criado, Gema ;
Tucoulou, Remi ;
Cloetens, Peter ;
Bleuet, Pierre ;
Bohic, Sylvain ;
Cauzid, Jean ;
Kieffer, Isabelle ;
Kosior, Ewelina ;
Laboure, Sylvain ;
Petitgirard, Sylvain ;
Rack, Alexander ;
Sans, Juan Angel ;
Segura-Ruiz, Jaime ;
Suhonen, Heikki ;
Susini, Jean ;
Villanova, Julie .
JOURNAL OF SYNCHROTRON RADIATION, 2012, 19 :10-18
[10]   Fabrication and preliminary testing of X-ray lenses in thick SU-8 resist layers [J].
Nazmov, V ;
Reznikova, E ;
Mohr, J ;
Snigirev, A ;
Snigireva, I ;
Achenbach, S ;
Saile, V .
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2004, 10 (10) :716-721