Single-event transients in bipolar linear integrated circuits

被引：59
作者：
Buchner, Stephen [1 ]
McMorrow, Dale
机构：
[1] QSS Grp Inc, Lanham, MD 20772 USA
[2] USN, Res Lab, Washington, DC 20375 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2006年 / 53卷 / 06期
关键词：
heavy ions; linear circuits; pulsed laser; single-event transients (SETs);
D O I：
10.1109/TNS.2006.882497
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Single-event transients (SETs) in linear integrated circuits have caused anomalies in a number of spacecraft. The consequences of these anomalies have spurred efforts to better understand SETS, including the mechanisms responsible for their generation, the best approaches for testing, how data should be analyzed and presented, and approaches for mitigation.
引用
收藏
页码：3079 / 3102
页数：24
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