Ultrafast x-ray diffraction using a streak-camera detector in averaging mode

被引：62

作者：

Larsson, J

Chang, Z

Judd, E

Schuck, PJ

Falcone, RW

Heimann, PA

Padmore, HA

Kapteyn, HC

Bucksbaum, PH

Murnane, MM

Lee, RW

Machacek, A

Wark, JS

Liu, X

Shan, B

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,ADV LIGHT SOURCE ACCELERATOR & FUS RES DIV,BERKELEY,CA 94720

[2] UNIV MICHIGAN,CTR ULTRAFAST OPT SCI,ANN ARBOR,MI 48109

[3] LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94551

[4] UNIV OXFORD,DEPT PHYS,CLARENDON LAB,OXFORD OX1 3PU,ENGLAND

[5] XIAN INST OPT & PRECIS MECH,XIAN 710000,PEOPLES R CHINA

来源：

OPTICS LETTERS | 1997年 / 22卷 / 13期

关键词：

D O I：

10.1364/OL.22.001012

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive su itch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70 ps. (C) 1997 Optical Society of America.

引用

页码：1012 / 1014

页数：3

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