Improvement in THz light extraction efficiencies with antireflection subwavelength gratings on a silicon prism

被引:8
|
作者
Huang, Ying [1 ]
Kosugi, Atsuki [2 ]
Naito, Yuya [1 ]
Takida, Yuma [3 ]
Minamide, Hiroaki [3 ]
Hane, Kazuhiro [2 ]
Kanamori, Yoshiaki [1 ]
机构
[1] Tohoku Univ, Dept Robot, Sendai, Miyagi 9808579, Japan
[2] Tohoku Univ, Dept Finemech, Sendai, Miyagi 9808579, Japan
[3] RIKEN, RIKEN Ctr Adv Photon, Sendai, Miyagi 9800845, Japan
关键词
Direct-bonding technology; Antireflection subwavelength grating; THz light extraction efficiencies; COUPLED-WAVE ANALYSIS; SURFACES; OPTICS; FILM;
D O I
10.35848/1347-4065/abe995
中图分类号
O59 [应用物理学];
学科分类号
摘要
An antireflection (AR) structure that incorporates a subwavelength grating (SWG) is a promising candidate for suppressing the Fresnel reflection of a silicon prism used as a component of an injection-seeded THz wave parametric generator (is-TPG) to improve the efficiency in extracting THz waves. Here, a two-dimensional binary AR-SWG with a 20 mu m period is designed and then numerically and experimentally realized. The measured transmittance of the AR-SWG is discovered to be greater than 80% from 0.5 to 4.0 THz and to exceed 90% from 1.25 to 2.83 THz. Moreover, the AR-SWG is tightly attached to the Si prism of the is-TPG by direct-bonding technology. Compared to the is-TPG without AR-SWGs, the output increases by 1.3-1.5 times from 1.09 to 2.52 THz. The improvement in THz light extraction efficiency is thus successfully demonstrated.
引用
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页数:5
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