Influence of silver migration on dielectric properties and reliability of relaxer based MLCCs

被引：42

作者：

Zuo, RZ ^{[1
]}

Li, LT ^{[1
]}

Gui, ZL ^{[1
]}

机构：

[1] Tsinghua Univ, Dept Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China

来源：

CERAMICS INTERNATIONAL | 2000年 / 26卷 / 06期

基金：

中国国家自然科学基金;

关键词：

ferro electric properties; migration;

D O I：

10.1016/S0272-8842(00)00003-1

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In order to study the micro-mechanism of silver migration which influences the reliability of relaxer based multilayer ceramic capacitors (MLCCs), micro-silver-doped PMN-PZN based relaxer ferroelectric ceramics were investigated for their microstructural and dielectric properties. SEM observations showed that the microstructure near the interface of MLCCs was greatly changed by the action of the inner silver/palladium electrode. The results indicate that silver migration causes grain growth, changes dielectric properties and decreases insulation resistance. Defect chemistry principles were used to explain the micro-mechanism of action of the silver dopant. (C) 2000 Elsevier Science Ltd and Techna S.r.l. All rights reserved.

引用

页码：673 / 676

页数：4

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