Electron emission from slow Ar17+ ions interacting with a Si surface

被引：0

作者：

Stolterfoht, N ^{[1
]}

Hoffmann, V ^{[1
]}

Niemann, D ^{[1
]}

Bremer, JH ^{[1
]}

机构：

[1] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany

来源：

PHYSICS OF ELECTRONIC AND ATOMIC COLLISIONS | 2000年 / 500卷

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

Experimental and theoretical methods were used to study the formation of hollow atoms during the interaction of Ar17+ projectiles with a Si(lll) surface. Electron spectra were taken in a wide range of projectile energies from 17 eV to 170 keV. Peak structures due to K- and L-Auger electrons were found to vary significantly with the projectile energy. The angular dependence of the Auger electron intensities were interpreted by means of model calculations yielding information about the decay depth of the hollow atoms within the first layers of the surface.

引用

页码：646 / 655

页数：10

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