Noise in Graphene Super lattices Grown on Hexagonal Boron Nitride

被引:17
|
作者
Li, Xuefei [1 ,2 ]
Lu, Xiaobo [3 ,4 ]
Li, Tiaoyang [1 ,2 ]
Yang, Wei [3 ,4 ]
Fang, Jianming [1 ,2 ]
Zhang, Guangyu [3 ,4 ]
Wu, Yanqing [1 ,2 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl High Magnet Field Ctr, Wuhan 430074, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Elect & Elect Engn, Wuhan 430074, Peoples R China
[3] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China
[4] Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China
关键词
graphene; boron nitride; superlattice; transistor; low frequency noise; 1/F NOISE; FREQUENCY; BEHAVIOR;
D O I
10.1021/acsnano.5b05283
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Existing in almost all electronic systems, the current noise spectral density, originated from the fluctuation of current, is by nature far more sensitive than the mean value of current, the most common characteristic parameter in electronic devices. Existing models on its origin of either carrier number or mobility are adopted in practically all electronic devices. For the past few decades, there has been no experimental evidence for direct association between 1/f noise and any other kinetic phenomena in solid state devices. Here, in the study of a van der Waals heterostructure of graphene on hexagonal BN superlattice, satellite Dirac points have been characterized through 1/f noise spectral density with pronounced local minima and asymmetric magnitude associated with its unique energy dispersion spectrum, which can only be revealed by scanning tunneling microscopy and low temperature magneto-transport measurement. More importantly, these features even emerge in the noise spectra of devices showing no minima in electric current, and are robust at all temperatures down to 4.3 K. In addition, graphene on h-BN exhibits a record low noise level of 1.6 x 10(-9) mu m(2) Hz(-1) at 10 Hz, more than 1 order of magnitude lower than previous results for graphene on SiO2. Such an epitaxial van der Waals material system not only enables an unprecedented characterization of fundamentals in solids by 1/f noise, but its superior interface also provides a key and feasible solution for further improvement of the noise level for graphene devices.
引用
收藏
页码:11382 / 11388
页数:7
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