High-speed atomic force microscope based on an astigmatic detection system

被引:15
作者
Liao, H-S [1 ]
Chen, Y-H [1 ]
Ding, R-F [1 ,2 ]
Huang, H-F [1 ,2 ]
Wang, W-M [1 ,2 ]
Hwu, E-T [1 ]
Huang, K-Y [2 ]
Chang, C-S [1 ]
Hwang, I-S [1 ]
机构
[1] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
[2] Natl Taiwan Univ, Dept Mech Engn, Taipei 10617, Taiwan
关键词
CANTILEVERS; SURFACE; PROBE;
D O I
10.1063/1.4898019
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology. (C) 2014 AIP Publishing LLC.
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页数:7
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