Projectile electron loss in collisions of Ar6+ and Ar8+ ions with He and Ar atoms

被引:5
|
作者
Schenk, Gerald [1 ]
Kirchner, Tom [1 ,2 ]
机构
[1] Tech Univ Clausthal, Inst Theoret Phys, D-38678 Clausthal Zellerfeld, Germany
[2] York Univ, Dept Phys & Astron, N York, ON M3J 1P3, Canada
关键词
MULTIPLE IONIZATION; IMPACT; MODEL;
D O I
10.1088/0953-4075/42/20/205202
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Multiple electron loss of fast Ar6+ (10.2 MeV amu(-1)) and Ar8+ (19 MeV amu(-1)) ions in collisions with neutral helium and argon target atoms is analysed in the independent particle model. It is found that losses from inner shells are significant such that subsequent Auger electron emission processes cannot be neglected. The Auger processes are taken into account on the level of a statistical model introduced recently. Total cross sections for multiple electron loss are calculated and compared with experimental data. In particular, ratios of q-fold to single ionization are described well.
引用
收藏
页数:5
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