Projectile electron loss in collisions of Ar6+ and Ar8+ ions with He and Ar atoms

被引:5
|
作者
Schenk, Gerald [1 ]
Kirchner, Tom [1 ,2 ]
机构
[1] Tech Univ Clausthal, Inst Theoret Phys, D-38678 Clausthal Zellerfeld, Germany
[2] York Univ, Dept Phys & Astron, N York, ON M3J 1P3, Canada
关键词
MULTIPLE IONIZATION; IMPACT; MODEL;
D O I
10.1088/0953-4075/42/20/205202
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Multiple electron loss of fast Ar6+ (10.2 MeV amu(-1)) and Ar8+ (19 MeV amu(-1)) ions in collisions with neutral helium and argon target atoms is analysed in the independent particle model. It is found that losses from inner shells are significant such that subsequent Auger electron emission processes cannot be neglected. The Auger processes are taken into account on the level of a statistical model introduced recently. Total cross sections for multiple electron loss are calculated and compared with experimental data. In particular, ratios of q-fold to single ionization are described well.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Electron multiplicity in slow collisions of Ar8+ ions with C60
    Martin, S
    Bernard, J
    Chen, L
    Denis, A
    Desesquelles, J
    EUROPEAN PHYSICAL JOURNAL D, 1998, 4 (01): : 1 - 6
  • [2] DOUBLE AND SINGLE ELECTRON-CAPTURE IN SLOW COLLISIONS OF AR-9+, AR-8+ IONS WITH HE ATOMS
    HUTTON, R
    PRIOR, MH
    CHANTRENNE, S
    CHEN, MH
    SCHNEIDER, D
    PHYSICAL REVIEW A, 1989, 39 (09): : 4902 - 4905
  • [3] Single-electron capture in 3-keV/u Ar8+ -He collisions
    Zhang, R. T.
    Zhu, X. L.
    Li, X. Y.
    Liu, L.
    Zhang, S. F.
    Feng, W. T.
    Guo, D. L.
    Gao, Y.
    Zhao, D. M.
    Wang, J. G.
    Ma, X.
    PHYSICAL REVIEW A, 2017, 95 (04)
  • [5] COLLISIONS OF MOF-6 IONS WITH AR ATOMS
    STOCKDALE, JAD
    ANNIS, BK
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1981, 26 (01): : 48 - 48
  • [6] ELECTRON-CAPTURE INTO METASTABLE AR8+ AND S6+ RECOIL IONS
    FOLKMANN, F
    CRAMON, KM
    MANN, R
    BEYER, HF
    PHYSICA SCRIPTA, 1983, T3 : 166 - 172
  • [7] Single- and double-electron capture in intermediate-energy Ar8+ + He collisions
    Zhang, Y. W.
    Gao, J. W.
    Wu, Y.
    Wang, J. G.
    Sisourat, N.
    Dubois, A.
    PHYSICAL REVIEW A, 2022, 106 (04)
  • [8] Electron-impact single-ionization of Ar6+ ions
    Becker, A.
    Spruck, K.
    Borovik, A., Jr.
    Schippers, S.
    Mueller, A.
    XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15, 2012, 388
  • [9] DISSOCIATIVE ELECTRON-CAPTURE IN AR8+/N-2 COLLISIONS
    REMSCHEID, A
    HUBER, BA
    WIESEMANN, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 98 (1-4): : 257 - 261
  • [10] Experimental investigation of state selective single-electron capture in 120 keV Ar8+ - He collisions
    Zhang, R. T.
    Ma, X.
    Zhu, X. L.
    Zhang, S. F.
    Feng, W. T.
    Guo, D. L.
    Gao, Y.
    Yan, S. C.
    Qian, D. B.
    Zhang, P. J.
    Xu, S.
    XXIX INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC, AND ATOMIC COLLISIONS (ICPEAC2015), PTS 1-12, 2015, 635