A Low-Cost Output Response Analyzer Circuit for ADC BIST

被引：0
|
作者：
Ting, Hsin-Wen [1 ]
Chao, I-Jen [1 ]
Lien, Yu-Chang [1 ]
Chang, Soon-Jyh [1 ]
Liu, Bin-Da [1 ]
机构：
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
来源：
IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS | 2009年
关键词：
analog-to-digital converter; sine-wave histogram test; COordinate rotation digital computer technique;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a low-cost ADC output response analyzer (ORA) circuit for built-in self-test (BIST) application is proposed. The sine-wave histogram testing method and the basic COordinate Rotation Digital Computer (CORDIC) technique are used to design the proposed ADC ORA circuit. The ADC's static and dynamic parameters can both be obtained using the proposed circuit. The basic CORDIC based ADC ORA circuit is designed and synthesized in a 0.18-mu m technology to analyze the outputs an 8-bit ADC to verify the designs. It shows a lower area overhead compared with the Fast Fourier transform (FFT) based realization.
引用
收藏
页码：371 / 374
页数：4
相关论文
共 14 条
  • [1] An Output Response Analyzer Circuit for ADC Built-in Self-Test
    Ting, Hsin-Wen
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2011, 27 (04): : 455 - 464
  • [2] An Output Response Analyzer Circuit for ADC Built-in Self-Test
    Hsin-Wen Ting
    Journal of Electronic Testing, 2011, 27 : 455 - 464
  • [3] Low-cost Dithering Generator for Accurate ADC Linearity Test
    Duan, Yan
    Chen, Tao
    Chen, Degang
    2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2016, : 1474 - 1477
  • [4] A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm
    Duan, Yan
    Chen, Tao
    Chen, Degang
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (06): : 709 - 720
  • [5] A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm
    Yan Duan
    Tao Chen
    Degang Chen
    Journal of Electronic Testing, 2017, 33 : 709 - 720
  • [6] A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter
    Chaganti, Shravan
    Xu, Li
    Chen, Degang
    2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,
  • [7] A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling
    Chaganti, Shravan K.
    Xu, Li
    Chen, Degang
    2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2018,
  • [8] A Low Cost Jitter Estimation and ADC Spectral Testing Method
    Xu, Li
    Chen, Degang
    2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2015, : 2277 - 2280
  • [9] Towards Building an Accurate Low-Cost Biofeedback Platform using Force Sensors
    Nel, Johann
    Dalbeth, Aaron
    Sen Gupta, Gourab
    Mercer, Ken
    PROCEEDINGS OF THE 2015 6TH INTERNATIONAL CONFERENCE ON AUTOMATION, ROBOTICS AND APPLICATIONS (ICARA), 2015, : 381 - 387
  • [10] A 65-nm low-noise low-cost Sigma Delta modulator for audio applications
    Guo, Liang
    Lu, Liao
    Hao, Luo
    Liu Xiaopeng
    Han Xiaoxia
    Yan, Han
    JOURNAL OF SEMICONDUCTORS, 2012, 33 (02)
12