Structural, photoluminescence and XPS properties of Tm3+ ions in ZnO nanostructures

被引：68
|
作者：
Kabongo, G. L. [1 ,2 ]
Mhlongo, G. H. [2 ]
Mothudi, B. M. [1 ]
Hillie, K. T. [2 ,3 ]
Mbule, P. S. [1 ]
Dhlamini, M. S. [1 ]
机构：
[1] Univ South Africa, Dept Phys, POB 392, ZA-0003 Pretoria, South Africa
[2] CSIR, Natl Ctr Nanostruct Mat, POB 395, ZA-0001 Pretoria, South Africa
[3] Univ Free State, Dept Phys, ZA-9300 Bloemfontein, South Africa
来源：
JOURNAL OF LUMINESCENCE | 2017年 / 187卷
基金：
新加坡国家研究基金会;
关键词：
ZnO nanostructures; Thulium; Bandgap; XPS; O; 1s; Tm; 4d; ROOM-TEMPERATURE FERROMAGNETISM; OPTICAL-PROPERTIES; THIN-FILMS; LUMINESCENT PROPERTIES; ENERGY-TRANSFER; LATTICE STRAIN; UP-CONVERSION; RED EMISSION; NANOPARTICLES; NANOCRYSTALS;
D O I：
10.1016/j.jlumin.2017.02.024
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Wurtzite structure) and high crystalline nature of both Tm3+ doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5 mol% Tm3+ sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：141 / 153
页数：13
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