Gas source MBE growth of GaN rich side of GaN1-xPx using ion-removed ECR radical cell

被引:40
作者
Iwata, K [1 ]
Asahi, H [1 ]
Asami, K [1 ]
Gonda, S [1 ]
机构
[1] OSAKA UNIV, INST SCI & IND RES, IBARAKI, OSAKA 567, JAPAN
基金
日本学术振兴会;
关键词
GaN; GaNP; gas source MBE; ECR radical cell; band gap narrowing; phase separation; EPITAXY; ALLOY;
D O I
10.1016/S0022-0248(96)00926-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaN-rich side of GaN1-xPx alloy are grown on (0 0 0 1) sapphire substrates by electron cyclotron resonance molecular beam epitaxy (ECR-MBE) using an ion removed ECR radical cell after the growth of high-quality GaN layers. GaN1-xPx exhibits potentially large variation of band-gap energy with P composition due to its large bowing. Maximum P composition of x = 0.015 is obtained. However, at the growth condition of high PH3 flow rate, phase separation into GaN-rich GaN1-xPx and GaP-rich GaP1-yNy is observed. Near band edge excitonic photoluminescence (PL) peak from GaN-rich side of GaN1-xPx layers shows large red shift with P composition. It suggests that the direct band edge of GaNP alloy shows large bowing.
引用
收藏
页码:150 / 155
页数:6
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