In and out plane X-ray diffraction of cellulose LB films

被引：3
作者：
Kimura, SI [1 ]
Kitagawa, M [1 ]
Kusano, H [1 ]
Kobayashi, H [1 ]
机构：
[1] Res Inst Technol, Tottori 6891112, Japan
来源：
NOVEL METHODS TO STUDY INTERFACIAL LAYERS | 2001年 / 11卷
关键词：
cellulose; Langmuir-Blodgett film; indium tin oxide; x-ray diffraction analysis;
D O I：
10.1016/S1383-7303(01)80029-6
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：255 / 264
页数：10
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