Absolute Absorption Measurements in Optical Coatings by Laser Induced Deflection

被引:12
作者
Bublitz, Simon [1 ]
Muehlig, Christian [1 ]
机构
[1] Leibniz Inst Photon Technol, Dept Microscopy, Albert Einstein Str 9, D-07745 Jena, Germany
关键词
absorption; thin films; photo-thermal technique; THIN-FILMS; NONLINEAR ABSORPTION; 2-PHOTON ABSORPTION; LUMINESCENCE; DEFECTS; LAF3; NM;
D O I
10.3390/coatings9080473
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Absolute measurement of residual absorption in optical coatings is steadily becoming more important in thin film characterization, in particular with respect to high power laser applications. A summary is given on the current ability of the laser induced deflection (LID) technique to serve sensitive photo-thermal absorption measurements combined with reliable absolute calibration based on an electrical heater approach. To account for different measurement requirements, several concepts have been derived to accordingly adapt the original LID concept. Experimental results are presented for prominent UV and deep UV laser wavelengths, covering a variety of factors that critically can influence the absorption properties in optical coatings e.g., deposition process, defects and impurities, intense laser irradiation and surface/interface engineering. The experimental findings demonstrate that by combining high sensitivity with absolute calibration, photo-thermal absorption measurements are able to be a valuable supplement for the characterization of optical thin films and coatings.
引用
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页数:14
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共 31 条
[1]   Photothermal common-path interferometry (PCI): new developments [J].
Alexandrovski, Alexei ;
Fejer, Martin ;
Markosyan, Ashot ;
Route, Roger .
SOLID STATE LASERS XVIII: TECHNOLOGY AND DEVICES, 2009, 7193
[2]   Nonlinear absorption of thin Al2O3 films at 193 nm [J].
Apel, O ;
Mann, K ;
Zoeller, A ;
Goetzelmann, R ;
Eva, E .
APPLIED OPTICS, 2000, 39 (18) :3165-3169
[3]   Optical and structural properties of LaF3 thin films [J].
Bischoff, Martin ;
Gaebler, Dieter ;
Kaiser, Norbert ;
Chuvilin, Andrey ;
Kaiser, Ute ;
Tuennermann, Andreas .
APPLIED OPTICS, 2008, 47 (13) :C157-C161
[4]   Optical properties of magnesium fluoride thin films produced by argon ion-beam assisted deposition [J].
Dumas, L ;
Quesnel, E ;
Pierre, F ;
Bertin, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2002, 20 (01) :102-106
[5]  
Gorling C., 2003, THESIS
[6]   Novel method to measure bulk absorption in optically transparent materials [J].
Guntau, M ;
Triebel, W .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (06) :2279-2282
[7]   Deep UV laser induced luminescence in oxide thin films [J].
Heber, J ;
Mühlig, C ;
Triebel, W ;
Danz, N ;
Thielsch, R ;
Kaiser, N .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 75 (05) :637-640
[8]   Deep UV laser induced fluorescence in fluoride thin films [J].
Heber, J ;
Mühlig, W ;
Triebel, W ;
Danz, N ;
Thielsch, R ;
Kaiser, N .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (01) :123-128
[9]   Cathodo- and photoluminescence increase in amorphous hafnium oxide under annealing in oxygen [J].
Ivanova, E. V. ;
Zamoryanskaya, M. V. ;
Pustovarov, V. A. ;
Aliev, V. Sh. ;
Gritsenko, V. A. ;
Yelisseyev, A. P. .
JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2015, 120 (04) :710-715
[10]   Role of two-photon absorption in Ta2O5 thin films in nanosecond laser-induced damage [J].
Jensen, Lars ;
Mende, Mathias ;
Schrameyer, Stefan ;
Jupe, Marco ;
Ristau, Detlev .
OPTICS LETTERS, 2012, 37 (20) :4329-4331