The electronic structure study of Fe L3 edge in CuFeO2

被引：0
|
作者：
Ozkendir, O. M. [1 ]
机构：
[1] Mersin Univ, Fac Tech Educ, Tarsus, Turkey
来源：
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS | 2009年 / 3卷 / 06期
关键词：
Thin films; Electronic properties; EXAFS; RAY CIRCULAR-DICHROISM; ORBITAL MAGNETISM; TRANSITION-METALS; THIN-FILMS; ABSORPTION; SPIN; CO;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The electronic structure of Fe in antiferromagnetic delafossite CuFeO2 were studied by using x-ray absorption fine structure (XAFS) spectroscopy around Fe L-3 absorption edge. The fundamental electronic and crystal structures of delafossite CuFeO2 are analyzed with electronic and magnetic behavior of metal iron L and K-edge. Magnetic properties of metal Fe Kedge and L-2,L-3-edges are probed by X-ray Magnetic Circular Dichroism (XMCD) calculations. The calculations are based on different choices of one electron potentials by using the real space multiple scattering method FEFF 8.2 code.
引用
收藏
页码：586 / 591
页数：6
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