Single-shot ptychography

被引:137
作者
Sidorenko, Pavel [1 ,2 ]
Cohen, Oren [1 ,2 ]
机构
[1] Technion Israel Inst Technol, Dept Phys, IL-32000 Haifa, Israel
[2] Technion Israel Inst Technol, Inst Solid State, IL-32000 Haifa, Israel
关键词
RAY-DIFFRACTION MICROSCOPY; PHASE RETRIEVAL; RESOLUTION; FIELD; SUPERRESOLUTION; INFORMATION; OBJECTS;
D O I
10.1364/OPTICA.3.000009
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ptychography is a particularly powerful coherent diffraction imaging technique. In ptychography, a localized beam that illuminates the object is scanned in a step-wise fashion, resulting in an array of partially overlapping probing spots on the object. The intensity diffraction pattern from each spot is recorded separately. Then, a complex-valued image is computationally constructed from the set of measured diffraction patterns. Ptychography is based on scanning, hence it results with a long overall acquisition time, in the order of a second or more. Also, the scanning limited resolution, vibration stability, drift, and dynamic range weaken the performances of ptychographic microscopes. We propose and analyze single-shot ptychography, where tens or hundreds of quasi-localized, partially overlapping beams illuminate the object simultaneously. Various schemes for single-shot ptychography, in both the transmission and reflection modes, with coherent and partially coherent illumination and for single-shot Fourier ptychography are proposed. Experimentally, we demonstrate single-shot ptychography with a 180 ms exposure time (limited by the CCD minimal acquisition time) using a sub-milliwatt diode laser that simultaneously illuminates the object with 49 partially overlapping beams. Single-shot ptychography, which combines the celebrated power of ptychography with (ultra) fast imaging, will surely open up new opportunities in microscopy. (C) 2015 Optical Society of America
引用
收藏
页码:9 / 14
页数:6
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