Statistical reconstruction for x-ray CT systems with non-continuous detectors

被引:18
作者
Zbijewski, Wojciech [1 ]
Defrise, Michel
Viergever, Max A.
Beekman, Freek J.
机构
[1] UMC Utrecht, Image Sci Inst, Dept Nucl Med, NL-3584 CG Utrecht, Netherlands
[2] UMC Utrecht, Rudolf Magnus Inst Neurosci, NL-3584 CG Utrecht, Netherlands
[3] AZ Vrije Univ Brussel, Univ Hosp, Dept Nucl Med, B-1090 Brussels, Belgium
[4] UMC Utrecht, Image Sci Inst, NL-3584 CX Utrecht, Netherlands
关键词
D O I
10.1088/0031-9155/52/2/007
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
We analyse the performance of statistical reconstruction (SR) methods when applied to non-continuous x-ray detectors. Robustness to projection gaps is required in x-ray CT systems with multiple detector modules or with defective detector pixels. In such situations, the advantage of statistical reconstruction is that it is able to ignore missing or faulty pixels and that it makes optimal use of the remaining line integrals. This potentially obviates the need to fill the sinogram discontinuities by interpolation or any other approximative preprocessing techniques. In this paper, we apply SR to cone beam projections of (i) a hypothetical modular detector micro-CT scanner and of (ii) a system with randomly located defective detector elements. For the modular-detector system, SR produces reconstruction volumes free of noticeable gap-induced artefacts as long as the location of detector gaps and selection of the scanning range provide complete object sampling in the central imaging plane. When applied to randomly located faulty detector elements, SR produces images free of substantial ring artefacts even for cases where defective pixels cover as much as 3% of the detector area.
引用
收藏
页码:403 / 418
页数:16
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