RADIO-WAVE DIAGNOSTICS OF PLANE LAYERED DIELECTRICS USING THE INVERSE PROBLEM

被引：1

作者：

Dzhala, V. R. ^{[1
]}

Kapko, L. I. ^{[1
]}

机构：

[1] Ukrainian Natl Acad Sci, Karpenko Physicomech Inst, Lvov, Ukraine

来源：

MATERIALS SCIENCE | 2009年 / 45卷 / 03期

关键词：

Compendex;

D O I：

10.1007/s11003-009-9193-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have developed a method for the radio-wave nondestructive testing of exfoliations in a dielectric layer. The method is based on the multifrequency sounding in 5-mm wavelength range and the solution of the inverse problem with determining the thicknesses of separate layers of a dielectric structure. We have also determined experimentally the precision and resolution of this method.

引用

页码：453 / 459

页数：7