RADIO-WAVE DIAGNOSTICS OF PLANE LAYERED DIELECTRICS USING THE INVERSE PROBLEM

被引：1
|
作者：
Dzhala, V. R. [1 ]
Kapko, L. I. [1 ]
机构：
[1] Ukrainian Natl Acad Sci, Karpenko Physicomech Inst, Lvov, Ukraine
来源：
MATERIALS SCIENCE | 2009年 / 45卷 / 03期
关键词：
Compendex;
D O I：
10.1007/s11003-009-9193-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have developed a method for the radio-wave nondestructive testing of exfoliations in a dielectric layer. The method is based on the multifrequency sounding in 5-mm wavelength range and the solution of the inverse problem with determining the thicknesses of separate layers of a dielectric structure. We have also determined experimentally the precision and resolution of this method.
引用
收藏
页码：453 / 459
页数：7
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