The co-axial aperture electromagnetic sensor and its application in material characterization

被引：38
作者：
Pournaropoulos, CL
Misra, DK
机构：
[1] Dept. of Elec. Eng. and Comp. Sci., University of Wisconsin-Milwaukee, Milwaukee, WI 53201
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 1997年 / 8卷 / 11期
关键词：
D O I：
10.1088/0957-0233/8/11/001
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An open-ended co-axial line has been used as an electromagnetic sensor or probe for various industrial and scientific applications. These applications are based on the principle that the characteristics of the echo signal produced by the cc-axial opening depend upon the sample material terminating the probe. Thus, if the aperture admittance (or reflection coefficient) characteristics can be precisely formulated, then the electrical parameters of the sample can be found. Several admittance models have been reported during the last two decades. A comparative study of these models is reported in this review. Furthermore, the inverse process of calculating the complex permittivity of materials is summarized.
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页码：1191 / 1202
页数：12
相关论文
共 131 条
[1]   AUTOMATIC MICROWAVE NETWORK MEASUREMENTS [J].
ADAM, SF .
PROCEEDINGS OF THE IEEE, 1978, 66 (04) :384-391
[2]   A NEW PRECISION AUTOMATIC MICROWAVE MEASUREMENT SYSTEM [J].
ADAM, SF .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1968, IM17 (04) :308-&
[3]   THE MEASUREMENT OF THE PROPERTIES OF MATERIALS [J].
AFSAR, MN ;
BIRCH, JR ;
CLARKE, RN ;
CHANTRY, GW .
PROCEEDINGS OF THE IEEE, 1986, 74 (01) :183-199
[4]   PRECISION MILLIMETER-WAVE MEASUREMENTS OF COMPLEX REFRACTIVE-INDEX, COMPLEX DIELECTRIC PERMITTIVITY, AND LOSS TANGENT OF COMMON POLYMERS [J].
AFSAR, MN .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :530-536
[5]   MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS [J].
AFSAR, MN ;
BUTTON, KJ .
PROCEEDINGS OF THE IEEE, 1985, 73 (01) :131-153
[6]  
ALTSCHULER HM, 1963, HDB MICROWAVE MEASUR, P495
[7]   DIELECTRIC MEASUREMENTS USING A RATIONAL-FUNCTION MODEL [J].
ANDERSON, JM ;
SIBBALD, CL ;
STUCHLY, SS .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (02) :199-204
[8]   PARALLEL-PLATE COAXIAL SENSOR FOR DIELECTRIC MEASUREMENTS - FURTHER ANALYSIS [J].
ANDERSON, L ;
STUCHLY, SS ;
GAJDA, GB .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1986, 35 (01) :89-91
[9]   ANALYSIS OF AN OPEN-ENDED COAXIAL LINE SENSOR IN LAYERED DIELECTRICS [J].
ANDERSON, LS ;
GAJDA, GB ;
STUCHLY, SS .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1986, 35 (01) :13-18
[10]  
[Anonymous], THESIS U WISCONSIN M
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