Probing the microelastic properties of nanobiological particles with tapping mode atomic force microscopy

被引：8

作者：

Shao, L ^{[1
]}

Tao, NJ ^{[1
]}

Leblanc, RM ^{[1
]}

机构：

[1] FLORIDA INT UNIV,DEPT PHYS,MIAMI,FL 33199

来源：

CHEMICAL PHYSICS LETTERS | 1997年 / 273卷 / 1-2期

基金：

美国国家卫生研究院;

关键词：

D O I：

10.1016/S0009-2614(97)00585-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have studied untreated photosystem II (PSII) membrane using tapping mode atomic force microscopy (AFM). The individual PSII particles distribute randomly in the membrane. Near the center of each particle, our AFM reveals an intramolecular cavity which confirms the previous electron microscopy of stained samples. The cavity can be reversibly enlarged from a few nm to as many as 40 nm in diameter by increasing the force on the AFM tip. A study of the particle's apparent height and cavity size under various forces provides unique information about the microelastic properties of single PSII particles. (C) 1997 Published by Elsevier Science B.V.

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页码：37 / 41

页数：5

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