A novel phase-shifting method based on strip marker

被引:26
作者
Gai, Shaoyan [1 ]
Da, Feipeng [1 ]
机构
[1] Southeast Univ, Minist Educ, Key Lab Measurement & Control Complex Syst, Nanjing 210096, Peoples R China
关键词
Projected fringe; Phase-shifting; Strip marker; Optical shape measurement; FOURIER-TRANSFORM PROFILOMETRY; UNWRAPPING ALGORITHM; INTERFEROMETRY; PROJECTION; OBJECTS;
D O I
10.1016/j.optlaseng.2009.03.020
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new phase-shifting method to obtain rapid phase measurement is proposed. Different from the traditional four-step phase-shifting algorithm, a strip marker is added in the projected fringe, which gives the indication for strip order. By the presented phase algorithm, not only the primary phase map but also the strip order can be obtained from the phase-shifting images, and thus the final phase map can be obtained. Using this method, no additional fringe pattern is required, that makes the time cost on fringe projection highly reduced. Experimental results show that the new algorithm has more efficiency in phase measurement. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:205 / 211
页数:7
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