Effect of margin widths on the residual stress in a multi-layer ceramic capacitor

The influence of margin widths on the evolution of residual stress components in a multilayer ceramic capacitor has been investigated numerically by systematically varying the widths of the housing and lateral margins. As for the in-plane residual stress components (compressive), sigma(11) is much relieved by the housing margin which exists along the length (axis 1) direction, while sigma(22) is much relieved by the lateral margin which exists along the width (axis 2) direction. The out-of-plane stress component sigma(33) (tensile) increases via both the housing and lateral margins within the range of the critical width (about 150 mu m), beyond which sigma(33) is not markedly influenced by the widths of margins. (c) 2006 Elsevier B.V. All rights reserved.