Absolute line intensities determination in the ν7 band of C2H4

被引：4

作者：

Walrand, J ^{[1
]}

Lengelé, M ^{[1
]}

Blanquet, G ^{[1
]}

Lepère, M ^{[1
]}

机构：

[1] Fac Univ Notre Dame Paix, Lab Spect, B-5000 Namur, Belgium

来源：

SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY | 2003年 / 59卷 / 03期

关键词：

absolute line intensities; tunable diode-laser spectrometer; equivalent width method; line profile fit method;

D O I：

10.1016/S1386-1425(02)00139-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Absolute intensities have been measured for 26 lines of C2H4 in the v(7) fundamental transition, using a tunable diode-laser spectrometer. These lines with 3 less than or equal to J" less than or equal to 21, 2 less than or equal to K-a less than or equal to 4, 2 less than or equal to K-c less than or equal to 20 are located in the spectral range 920-980 cm(-1). The intensities have been measured by using two methods: the equivalent width method (EWM) and the line profile fit method (FPM). For the last one, three models have been tested: Voigt, Rautian and Galatry profiles. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：421 / 426

页数：6