Absolute line intensities determination in the ν7 band of C2H4

被引:4
作者
Walrand, J [1 ]
Lengelé, M [1 ]
Blanquet, G [1 ]
Lepère, M [1 ]
机构
[1] Fac Univ Notre Dame Paix, Lab Spect, B-5000 Namur, Belgium
关键词
absolute line intensities; tunable diode-laser spectrometer; equivalent width method; line profile fit method;
D O I
10.1016/S1386-1425(02)00139-7
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Absolute intensities have been measured for 26 lines of C2H4 in the v(7) fundamental transition, using a tunable diode-laser spectrometer. These lines with 3 less than or equal to J" less than or equal to 21, 2 less than or equal to K-a less than or equal to 4, 2 less than or equal to K-c less than or equal to 20 are located in the spectral range 920-980 cm(-1). The intensities have been measured by using two methods: the equivalent width method (EWM) and the line profile fit method (FPM). For the last one, three models have been tested: Voigt, Rautian and Galatry profiles. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:421 / 426
页数:6
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