Chemical effects in C60 irradiation of polymers

被引：49
作者：
Moellers, R.
Tuccitto, N.
Torrisi, V.
Niehuis, E.
Licciardello, A.
机构：
[1] ION TOF GmbH, D-48149 Munster, Germany
[2] Univ Catania, Dipartimento Sci Chim, I-95125 Catania, Italy
来源：
APPLIED SURFACE SCIENCE | 2006年 / 252卷 / 19期
关键词：
ToF-SIMS; cluster SIMS; fullerene ion beam; depth profiling; polymers; radiation damage; PRIMARY ION-BOMBARDMENT; MASS-SPECTROMETRY; THIN-FILMS; BEAM; POLY(ACRYLATES); DEGRADATION; CHAIN;
D O I：
10.1016/j.apsusc.2006.02.083
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The C-60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(alpha-methyl) styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C-60 appears to depend strongly on the chemical nature of the system under study. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：6509 / 6512
页数：4
相关论文
共 17 条
[1]  
BRIGGS D, 1992, PRACTICAL SURFACE AN, V2, P373
[2]   ION-CHAIN INTERACTION IN KEV ION-BEAM-IRRADIATED POLYSTYRENE [J].
CALCAGNO, L ;
FOTI, G ;
LICCIARDELLO, A ;
PUGLISI, O .
APPLIED PHYSICS LETTERS, 1987, 51 (12) :907-909
[3]   Ion beam assisted unzipping of PMMA [J].
Fragala, ME ;
Compagnini, G ;
Torrisi, L ;
Puglisi, O .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 141 (1-4) :169-173
[4]  
GARRETT RW, 1991, ACS SYM SER, V475, P146
[5]   Secondary ion mass spectrometry using cluster primary ion beams [J].
Gillen, G ;
Fahey, A .
APPLIED SURFACE SCIENCE, 2003, 203 :209-213
[6]  
Gillen G, 1998, RAPID COMMUN MASS SP, V12, P1303, DOI 10.1002/(SICI)1097-0231(19981015)12:19<1303::AID-RCM330>3.0.CO
[7]  
2-7
[8]   Cluster primary ion bombardment of organic materials [J].
Kollmer, F .
APPLIED SURFACE SCIENCE, 2004, 231 :153-158
[9]   Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment [J].
Kotter, F ;
Benninghoven, A .
APPLIED SURFACE SCIENCE, 1998, 133 (1-2) :47-57
[10]   Ion beam effects on the surface and on the bulk of thin films of polymethylmethacrylate [J].
Licciardello, A ;
Fragala, ME ;
Foti, G ;
Compagnini, G ;
Puglisi, O .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 116 (1-4) :168-172
12