Rietveld refinement using synchrotron X-ray powder diffraction data collected in transmission geometry using an imaging-plate detector: Application to standard m-ZrO2

被引:75
作者
Gualtieri, A
Norby, P
Hanson, J
Hriljac, J
机构
[1] BROOKHAVEN NATL LAB, DEPT CHEM, UPTON, NY 11973 USA
[2] BROOKHAVEN NATL LAB, DEPT APPL SCI, UPTON, NY 11973 USA
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1996年 / 29卷 / pt 6期
关键词
D O I
10.1107/S0021889896008199
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The results of Rietveld refinements using synchrotron X-ray powder diffraction data collected in transmission mode with a new flat imaging-plate (IF) technique agree with those obtained from other techniques. m-ZrO2 was chosen as test compound because it was the standard selected by the Commission on Powder Diffraction of the International Union of Crystallography for a round robin of Rietveld refinement using data obtained by different techniques and from different laboratories [Hill & Cranswick (1994). J. Appl. Cryst. 27, 802-844]. For comparison, new data were also collected using a gas-filled position-sensitive detector. Powder diffraction using a flat IP detector requires a modification to the geometric term of the Lorentz factor and the zero-shift correction. Other factors that were accurately taken into account are the polarization of the synchrotron beam, the angle-dependent variations induced by the use of a flat detector and the absorption.
引用
收藏
页码:707 / 713
页数:7
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