Test Method for Overload Protection Based on 9000 Power Auto Test System

被引:0
作者
Xia, Qiangmin [1 ]
机构
[1] Wuhan Inst Digital Engn, Wuhan, Peoples R China
来源
2022 9TH INTERNATIONAL FORUM ON ELECTRICAL ENGINEERING AND AUTOMATION, IFEEA | 2022年
关键词
power supply module; overload; test;
D O I
10.1109/IFEEA57288.2022.10037954
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper introduces the concept of overload protection for power supply module,and presents the principle and test method for overload protection for power supply module based on 9000 power auto test system.
引用
收藏
页码:364 / 367
页数:4
相关论文
共 50 条
  • [42] Analysis on the Optical Performance and Test Technology of the Multiple Beam of the High-power Laser System
    Li, Jianfang
    Zhou, Yanmin
    PROCEEDINGS OF THE 2015 2ND INTERNATIONAL CONFERENCE ON ELECTRICAL, COMPUTER ENGINEERING AND ELECTRONICS (ICECEE 2015), 2015, 24 : 88 - 91
  • [43] Design of test system of the control and logic transform device of the flight control system based on FPGA
    Wang Liru
    Zhang Qingrong
    SIGNAL ANALYSIS, MEASUREMENT THEORY, PHOTO-ELECTRONIC TECHNOLOGY, AND ARTIFICIAL INTELLIGENCE, PTS 1 AND 2, 2006, 6357
  • [44] Development of Self-Service Terminals Test System Based on Design Pattern
    Zeng, Fanfeng
    Zhang, Yinke
    2009 THIRD INTERNATIONAL SYMPOSIUM ON INTELLIGENT INFORMATION TECHNOLOGY APPLICATION, VOL 1, PROCEEDINGS, 2009, : 340 - 342
  • [45] The Vehicle Stability Test System Based on Active Brake Control for Overturning Prevention
    Zhao Jianzhu
    Zhang Lu
    Zhang Zhongfu
    Wang Guoye
    Chen Yan
    MANUFACTURING PROCESS AND EQUIPMENT, PTS 1-4, 2013, 694-697 : 1340 - 1348
  • [46] Design of TDD-Based Automation System for Android Application Test Automation
    Park, Min-Hyung
    Kim, Hyung-Joon
    Jang, Young-Hwan
    Park, Seok-Cheon
    ADVANCES IN COMPUTER SCIENCE AND UBIQUITOUS COMPUTING, 2018, 474 : 1440 - 1444
  • [47] Design and implementation of T3 periodic test for reactor protection system of TMSR-SF1
    Liu Z.
    Hou J.
    Liu G.
    Hedongli Gongcheng/Nuclear Power Engineering, 2016, 37 (05): : 105 - 110
  • [48] A Low-Cost TSV Test and Diagnosis Scheme Based on Binary Search Method
    Zhang, Xiaolong
    Li, Huiyun
    Jiang, Li
    Xu, Qiang
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 23 (11) : 2639 - 2647
  • [49] A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs
    Ruan, Aiwu
    Jie, Bairui
    Wan, Li
    Yang, Junhao
    Xiang, Chuanyin
    Zhu, Zujian
    Wang, Yu
    MICROELECTRONICS RELIABILITY, 2014, 54 (08) : 1627 - 1635
  • [50] Research and Test of Power-Loop-Based Dynamic Multi-Peak MPPT Algorithm
    Zhu, Qing
    Zhang, Xing
    Li, Shanshou
    Liu, Chun
    Ni, Hua
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2016, 63 (12) : 7349 - 7359