Direct imaging of photoconductivity of solar cells by using a near-field scanning microwave microprobe

被引：15
|
作者：
Hovsepyan, Artur [1 ,2 ]
Babajanyan, Arsen [1 ,2 ]
Sargsyan, Tigran [1 ,2 ]
Melikyan, Harutyun [1 ,2 ]
Kim, Seungwan [1 ,2 ]
Kim, Jongchel [1 ,2 ]
Lee, Kiejin [1 ,2 ]
Friedman, Barry [3 ]
机构：
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Sogang Univ, Basic Sci Inst Cell Damage Control, Seoul 121742, South Korea
[3] Sam Houston State Univ, Dept Phys, Huntsville, TX 77341 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2009年 / 106卷 / 11期
关键词：
microwave reflectometry; photoconductivity; photovoltaic effects; silicon; solar cells; RESISTANCE; MICROSCOPE; LIFETIME;
D O I：
10.1063/1.3259366
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A near-field scanning microwave microprobe (NSMM) technique has been used to investigate the photovoltaic effect in solar cells. As the photoconductivity of the n-type silicon layer in the solar cells was varied due to the incident light intensities and the wavelength, we could directly observe the photoconductivity changes inside the solar cells by measuring the change of reflection coefficient S-11 of the NSMM at an operating frequency near 4.1 GHz. We also directly imaged the photoconductivity changes by NSMM. Photoconductivity in solar cells is determined from the visualized microwave reflection coefficient changes at the interfaces with high sensitivity.
引用
收藏
页数：6
相关论文
共 50 条
  • [21] Near-field imaging techniques for surface inspection
    Dannenberg, Florian
    Hahlweg, Cornelius
    Pescoller, Lukas
    Zhao, Wenjing
    NOVEL OPTICAL SYSTEMS DESIGN AND OPTIMIZATION XVII, 2014, 9193
  • [22] Laser beam scanning using near-field scanning optical microscopy nanoscale silicon-based photodetector
    Karelits, Matityahu
    Mandelbaum, Yaakov
    Chelly, Avraham
    Karsenty, Avi
    JOURNAL OF NANOPHOTONICS, 2018, 12 (03)
  • [23] THz Near-Field Imaging Sensor Using Integrated Substrateless Silicon Interferometer
    Iwamatsu, Shuya
    Headland, Daniel
    Mohammad, Israa
    Fujita, Masayuki
    Stoehr, Andreas
    PROCEEDINGS OF THE 2024 15TH GERMAN MICROWAVE CONFERENCE, GEMIC, 2024, : 221 - 224
  • [24] THz near-field imaging and spectroscopy with nanoscale resolution
    Reich, Aina
    Eisele, Max
    Huber, Andreas
    2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2018,
  • [25] Near-field transport imaging applied to photovoltaic materials
    Xiao, Chuanxiao
    Jiang, Chun-Sheng
    Moseley, John
    Simon, John
    Schulte, Kevin
    Ptak, Aaron J.
    Johnston, Steve
    Gorman, Brian
    Al-Jassim, Mowafak
    Haegel, Nancy M.
    Moutinho, Helio
    SOLAR ENERGY, 2017, 153 : 134 - 141
  • [26] Plasmonic light enhancement in the near-field of metallic nanospheroids for application in intermediate band solar cells
    Mendes, Manuel J.
    Luque, Antonio
    Tobias, Ignacio
    Marti, Antonio
    APPLIED PHYSICS LETTERS, 2009, 95 (07)
  • [27] Feasibility of using near-field microwave reflectometry for monitoring autogenous crack healing in cementitious materials
    Mehdipour, Iman
    Zoughi, Reza
    Khayat, Kamal H.
    CEMENT & CONCRETE COMPOSITES, 2018, 85 : 161 - 173
  • [28] Scanning optical near-field resolution analyzed in terms of communication modes
    Martinsson, Per
    Lajunen, Hanna
    Friberg, Ari T.
    OPTICS EXPRESS, 2006, 14 (23): : 11392 - 11401
  • [29] Near-field scanning optical microscope based on fast Birefringence measurement
    Ohkubo, S
    Umeda, N
    SENSORS AND MATERIALS, 2001, 13 (08) : 433 - 443
  • [30] Inducing superconductivity at a nanoscale: photodoping with a near-field scanning optical microscope
    Decca, RS
    Drew, HD
    Maiorov, B
    Guimpel, J
    Osquiguil, EJ
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 407 - 411
12345