共 50 条
- [41] Use of Scanning Electron Microscopy in the Detection of Flaws in Piezoelectric and Ferroelectric Crystals Ind Lab (USSR), 8 (501):
- [42] Use of scanning electron microscopy in the detection of flaws in piezoelectric and ferroelectric crystals INDUSTRIAL LABORATORY, 1996, 62 (08): : 501 - 503
- [45] Adaptive Scanning in Atomic Force Microscopy ICRA: 2009 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-7, 2009, : 2372 - 2377