Structural examination of lithium niobate ferroelectric crystals by combining scanning electron microscopy and atomic force microscopy

被引:2
|
作者
Efremova, P. V. [1 ]
Ped'ko, B. B. [1 ]
Kuznecova, Yu. V. [1 ]
机构
[1] Tver State Univ, Sadovyi Per 35, Tver 170002, Russia
关键词
OPTICAL INHOMOGENEITY;
D O I
10.1134/S1063784216020109
中图分类号
O59 [应用物理学];
学科分类号
摘要
The structure of lithium niobate single crystals is studied by a complex technique that combines scanning electron microscopy and atomic force microscopy. By implementing the piezoresponse force method on an atomic force microscope, the domain structure of lithium niobate crystals, which was not revealed without electron beam irradiation, is visualized.
引用
收藏
页码:313 / 315
页数:3
相关论文
共 50 条
  • [21] Combining Atomic Force Microscopy with Polarized Raman Microscopy
    Sawatzki, Juergen
    Wehlack, Carsten
    Possart, Wulff
    Thoene, Andrea
    Hannss, Matthias
    Schlipper, Ralph
    Rider, Tim
    XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY, 2010, 1267 : 800 - +
  • [22] Comparative atomic force and scanning electron microscopy for fine structural images of nerve cells
    Tojima, T
    Hatakeyama, D
    Yamane, Y
    Kawabata, K
    Ushiki, T
    Ogura, S
    Abe, K
    Ito, E
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6B): : 3855 - 3859
  • [23] Structural aspects of the extracellular matrix of the tendon: An atomic force and scanning electron microscopy study
    Raspanti, M
    Guizzardi, S
    ARCHIVES OF HISTOLOGY AND CYTOLOGY, 2002, 65 (01) : 37 - 43
  • [24] Comparative atomic force and scanning electron microscopy for fine structural images of nerve cells
    Hokkaido Univ, Sapporo, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 6 B (3855-3859):
  • [26] Simultaneous Nanomechanical and Electrochemical Mapping: Combining Peak Force Tapping Atomic Force Microscopy with Scanning Electrochemical Microscopy
    Knittel, Peter
    Mizaikoff, Boris
    Kranz, Christine
    ANALYTICAL CHEMISTRY, 2016, 88 (12) : 6174 - 6178
  • [27] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY FOR MICROTRIBOLOGY
    KANEKO, R
    NONAKA, K
    YASUDA, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (02): : 291 - 292
  • [28] THE INFLUENCE OF TERPENES ON HUMAN STRATUM CORNEUM BY FLUORESCENCE MICROSCOPY, ATOMIC FORCE MICROSCOPY AND SCANNING ELECTRON MICROSCOPY
    Cal, Krzysztof
    Stefanowska, Justyna
    Govedarica, Biljana
    Planinsek, Odon
    Srcic, Stane
    Bazela, Karolina
    Debowska, Renata
    ACTA POLONIAE PHARMACEUTICA, 2017, 74 (04): : 1063 - 1070
  • [29] Scanning Electron Microscopy and Atomic Force Microscopy in the study of damaged and weak hair treatment
    Tyszczuk, Bozena
    Nowakowska, Julita
    Strzelecki, Janusz
    Adamczyk, Dorota
    Debowska, Renata
    Rogiewicz, Katarzyna
    Eris, Irena
    JOURNAL OF INVESTIGATIVE DERMATOLOGY, 2010, 130 : S90 - S90
  • [30] Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy
    Boeck, T
    Schmidt, K
    Gerlitzke, A
    Wilde, PM
    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997, 1998, 160 : 221 - 224