Conductivity Size Effect of Square Cross-Section Polycrystalline Nanowires

被引:4
作者
Li, Rui [1 ]
Mi, Lan [2 ]
Wang, Jian [2 ]
Mao, Mao [2 ]
Gu, Wenhua [3 ]
Zhu, Yongkai [4 ]
机构
[1] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engineer, Xian 710049, Shaanxi, Peoples R China
[2] Xi An Jiao Tong Univ, Food Equipment Engn & Sci, Xian 710049, Shaanxi, Peoples R China
[3] Nanjing Univ Sci & Technol, Sch Elect & Opt Engn, Nanjing 210094, Jiangsu, Peoples R China
[4] Nanjing Univ Aeronaut & Astronaut, Coll Automat Engn, Nanjing 210016, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
conductivity; size effect; polycrystalline; square cross-section; GRAIN-BOUNDARY SCATTERING; ELECTRICAL-RESISTIVITY; SURFACE-ROUGHNESS; THIN-FILMS; COPPER;
D O I
10.3390/ma12132129
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A theoretical model for the electrical conductivity size effect of square nanowires is proposed in this manuscript, which features combining the three main carrier scattering mechanisms in polycrystalline nanowires together, namely, background scattering, external surface scattering, as well as grain boundary scattering. Comparisons to traditional models and experiment data show that this model achieves a higher correlation with the experiment data.
引用
收藏
页数:10
相关论文
共 22 条
[1]  
[Anonymous], 1950, PROC R SOC LON SER-A
[2]   The effect of electron scattering from disordered grain boundaries on the resistivity of metallic nanostructures [J].
Arenas, Claudio ;
Henriquez, Ricardo ;
Moraga, Luis ;
Munoz, Enrique ;
Munoz, Raul C. .
APPLIED SURFACE SCIENCE, 2015, 329 :184-196
[3]  
Chambers R. G., 1950, Proc. R. Soc. A, V202, P394
[4]   A study of the size effect on the temperature-dependent resistivity of bismuth nanowires with rectangular cross-sections [J].
Chiu, P ;
Shih, I .
NANOTECHNOLOGY, 2004, 15 (11) :1489-1492
[5]  
Dimmich R., 1986, Active and Passive Electronic Components, V12, P103, DOI 10.1155/1986/75953
[6]   THE ELECTRICAL CONDUCTIVITY OF THIN WIRES [J].
DINGLE, RB .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1950, 201 (1067) :545-560
[7]   Size effects in the electrical resistivity of polycrystalline nanowires [J].
Durkan, C ;
Welland, ME .
PHYSICAL REVIEW B, 2000, 61 (20) :14215-14218
[8]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[9]   Electrical properties of superfilled sub-micrometer silver metallizations [J].
Josell, D ;
Burkhard, C ;
Li, Y ;
Cheng, YW ;
Keller, RR ;
Witt, CA ;
Kelley, DR ;
Bonevich, JE ;
Baker, BC ;
Moffat, TP .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (01) :759-768
[10]   Investigation of size effects in the electrical resistivity of single electrochemically fabricated gold nanowires [J].
Karim, S. ;
Ensinger, W. ;
Cornelius, T. W. ;
Neumann, R. .
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2008, 40 (10) :3173-3178