Optical and structural studies in Eu-implanted AlN films

被引:17
作者
Peres, M.
Cruz, A.
Soares, M. J.
Neves, A. J.
Monteiro, T. [1 ]
Lorenz, K.
Alves, E.
机构
[1] Univ Aveiro, FSCOSD, Dept Fis, P-3810193 Aveiro, Portugal
[2] Inst Tecnol & Nucl, P-2686953 Sacavem, Portugal
关键词
AlN; RE's; ion implantation; RBS/C; PL;
D O I
10.1016/j.spmi.2006.07.031
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Eu ions were incorporated into A1N thin films using ion implantation, and the influence of the postimplant annealing ambient on structural and optical properties was investigated. Eu is incorporated into lattice sites which are slightly displaced from the substitutional Al sites. When compared with the as-implanted sample the near-substitutional ion fraction is reduced due to the thermal annealing in different atmospheres. The A1N crystal quality does not change with different annealing conditions, but sensitive defect-related emission bands are developed under different annealing temperatures. Eu3+ optical activation is detected for all the annealed samples. No spectral changes are observed for the shape of the intra-4f(65) D-0 -> F-7(2) transition, suggesting that a similar site symmetry is preserved even when a slight displacement from the substitutitional site of the Eu3+ ions occurs. The role of the annealing conditions on the spectral position and thermal quenching of the D-5(0) -> F-7(2) transition is discussed. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:537 / 544
页数:8
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