Measurements of radiation pressure effect in cryogenic sapphire dielectric resonators

被引:29
作者
Chang, S
Mann, AG
Luiten, AN
Blair, DG
机构
[1] Department of Physics, University of Western Australia, Nedlands, WA
关键词
D O I
10.1103/PhysRevLett.79.2141
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report observations of the radiation pressure induced expansion of a solid dielectric resonator. This effect causes a fundamental limit to the frequency stability of the resonator. The measurements were made on four high e-factor quasi-TE ''whispering gallery'' modes from 9.9 to 12.6 GHz in a monocrystalline sapphire resonator at liquid helium temperatures. The fractional frequency shift is -1.0 +/- 0.1 x 10(-12) per mu J of energy stored in the resonator. This result is consistent in sign, magnitude, and linearity with the radiation pressure induced lattice expansion term predicted by Braginsky.
引用
收藏
页码:2141 / 2144
页数:4
相关论文
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Stein S. R., 1975, Proceedings of the 29th Annual Frequency Control Symposium, P321