Refractive index reconstruction of graded-index buried channel waveguides from their mode intensities

被引：32
|
作者：
vonBibra, ML
Roberts, A
机构：
[1] School of Physics, University of Melbourne, Parkville
[2] University of Sydney, Sydney, NSW
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 1997年 / 15卷 / 09期
基金：
澳大利亚研究理事会;
关键词：
ion beam applications; optical device fabrication; optical planar waveguides; optical waveguides; optical waveguide theory;
D O I：
10.1109/50.622896
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The refractive index distribution has been determined for a number of graded-index, single-mode, buried channel waveguides, formed by irradiation with a high energy focused ion beam, The refractive index has been calculated from the waveguide's mode field intensity at a wavelength of 670 mn, via an inversion of the scalar wave equation, Waveguides with doses in the range 0.7 x 10(15)-4.1 x 10(15) ions.cm(-2) exhibited a peak refractive index change increasing linearly with ion dose, in the range 0.02-0.08%, and the results are consistent with profiles derived from TRIM simulations.
引用
收藏
页码：1695 / 1699
页数：5
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