Surface Defect Detection based on Improved YOLOv3-Tiny Algorithm

被引:0
作者
Yuan, Huaqing [1 ]
He, Yi [1 ]
Zheng, Xuan [1 ]
Li, Changbin [1 ]
Wu, Aiguo [1 ]
机构
[1] Tianjin Univ, Sch Elect & Informat Engn, Tianjin 300072, Peoples R China
来源
2022 41ST CHINESE CONTROL CONFERENCE (CCC) | 2022年
关键词
Defect Detection; YOLO; Attention Mechanism; Automated industry; CLASSIFICATION;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
To take into account both accuracy and real-time performance in surface defect detection, we propose a new surface defect detection algorithm based on YOLOv3- Tiny. The algorithm first adds a YOLO layer that fuses shallow and deep features on the basis of YOLOv3- Tmy, to enhance the capabilities of microscopic defect detection through multi-scale features fusion. And the hybrid attention mechanism module, named SE-C, is employed before every YOLO layer. The SE-C module can decrease e weight of irrelevant back ound's features while improving the weight of the defect's features, it will improve the algorithm s robustness and accuracy. Finally, the algorithm re-clusters the anchor boxes based on K-means in each dataset. The experimental results reveal the improved algorithm has a good trade-off between the accuracy and the speed of defect detection, especially in easilyconfused background. More importantly, the algorithm can also be applied to other object detection on similar scenes.
引用
收藏
页码:5769 / 5774
页数:6
相关论文
共 24 条
[1]   Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum [J].
Bai, Xiaolong ;
Fang, Yuming ;
Lin, Weisi ;
Wang, Lipo ;
Ju, Bing-Feng .
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2014, 10 (04) :2135-2145
[2]   Automatic Defect Detection of Fasteners on the Catenary Support Device Using Deep Convolutional Neural Network [J].
Chen, Junwen ;
Liu, Zhigang ;
Wang, Hongrui ;
Nunez, Alfredo ;
Han, Zhiwei .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2018, 67 (02) :257-269
[3]   Feature selection for surface defect classification of extruded aluminum profiles [J].
Chondronasios, Apostolos ;
Popov, Ivan ;
Jordanov, Ivan .
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2016, 83 (1-4) :33-41
[4]  
DAGM, 2007, DAGM 2007 DATASETS
[5]   Beans quality inspection using correlation-based granulometry [J].
de Araujo, Sidnei Alves ;
Pessota, Jorge Henrique ;
Kim, Hae Yong .
ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE, 2015, 40 :84-94
[6]  
Divvala S, 2017, IEEE T PATTERN ANAL, V39, P1137
[7]   Deep Multitask Learning for Railway Track Inspection [J].
Gibert, Xavier ;
Patel, VishalM. ;
Chellappa, Rama .
IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS, 2017, 18 (01) :153-164
[8]   Rich feature hierarchies for accurate object detection and semantic segmentation [J].
Girshick, Ross ;
Donahue, Jeff ;
Darrell, Trevor ;
Malik, Jitendra .
2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, :580-587
[9]   Surface defect classification of steels with a new semi-supervised learning method [J].
He Di ;
Xu Ke ;
Zhou Peng ;
Zhou Dongdong .
OPTICS AND LASERS IN ENGINEERING, 2019, 117 :40-48
[10]   Deep Residual Learning for Image Recognition [J].
He, Kaiming ;
Zhang, Xiangyu ;
Ren, Shaoqing ;
Sun, Jian .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :770-778