Two-beam SPIDER for dual-pulse single-shot characterization

被引：14

作者：

French, Doug ^{[1
]}

Dorrer, Christophe ^{[2
]}

Jovanovic, Igor ^{[1
]}

机构：

[1] Purdue Univ, Sch Nucl Engn, W Lafayette, IN 47907 USA

[2] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA

来源：

OPTICS LETTERS | 2009年 / 34卷 / 21期

关键词：

SPECTRAL PHASE INTERFEROMETRY; ELECTRIC-FIELD RECONSTRUCTION; ULTRASHORT LASER-PULSES;

D O I：

10.1364/OL.34.003415

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe an innovative design of the spectral-phase-interferometry-for-direct-electric-field-reconstruction (SPIDER) technique applicable to the simultaneous measurement of the electric field of two ultrashort pulses, e.g., a reference and probe pulse. We demonstrate the utility of the device by measuring material dispersion in a single shot by subtracting the reconstructed phase of a dispersed pulse and a reference pulse and by quantifying phase differences arising from nonlinear effects. Our two-beam technique is particularly suitable for use in experiments performed on high-energy, ultrafast laser systems operating in a single-shot mode with significant pulse-to-pulse variations. (C) 2009 Optical Society of America

引用

页码：3415 / 3417

页数：3

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