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Second-nearest-neighbor modified embedded-atom method interatomic potential for V-M (M = Cu, Mo, Ti) binary systems
被引:12
|作者:
Wang, Jaemin
[1
]
Lee, Byeong-Joo
[1
]
机构:
[1] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 37673, South Korea
基金:
新加坡国家研究基金会;
关键词:
2NN MEAM;
Interatomic potential;
Atomistic simulation;
V-Cu;
V-Mo;
V-Ti;
D O I:
10.1016/j.commatsci.2020.110177
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Interatomic potentials for V-M (M = Cu, Mo, Ti) binary systems have been developed within the framework of the second-nearest-neighbor modified embedded-atom method (2NN MEAM) formalism. The potentials reproduce a wide range of fundamental material properties such as thermodynamic and structural properties of compound and solution phases in reasonable agreement with experimental data or CALPHAD and first-principles calculations. The reasonable reproduction of material properties implies that the potentials can be combined with those of V-H and M-H systems for a permeability study of hydrogen in vanadium alloys or can be extended for further development of V-containing ternary system potentials.
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页数:8
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