Second-nearest-neighbor modified embedded-atom method interatomic potential for V-M (M = Cu, Mo, Ti) binary systems

被引:12
|
作者
Wang, Jaemin [1 ]
Lee, Byeong-Joo [1 ]
机构
[1] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 37673, South Korea
基金
新加坡国家研究基金会;
关键词
2NN MEAM; Interatomic potential; Atomistic simulation; V-Cu; V-Mo; V-Ti;
D O I
10.1016/j.commatsci.2020.110177
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Interatomic potentials for V-M (M = Cu, Mo, Ti) binary systems have been developed within the framework of the second-nearest-neighbor modified embedded-atom method (2NN MEAM) formalism. The potentials reproduce a wide range of fundamental material properties such as thermodynamic and structural properties of compound and solution phases in reasonable agreement with experimental data or CALPHAD and first-principles calculations. The reasonable reproduction of material properties implies that the potentials can be combined with those of V-H and M-H systems for a permeability study of hydrogen in vanadium alloys or can be extended for further development of V-containing ternary system potentials.
引用
收藏
页数:8
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