Self-checking and fault tolerance quality assessment using Fault Sampling

被引:6
作者
Gonçalves, FM [1 ]
Santos, MB [1 ]
Teixeira, IC [1 ]
Teixeira, JP [1 ]
机构
[1] IST, INESC, ID, P-1000029 Lisbon, Portugal
来源
17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2002年
关键词
D O I
10.1109/DFTVS.2002.1173518
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The computational effort associated with Fault Simulation (FS) processes in digital systems can become overwhelming, due to circuit complexity, test pattern size or fault list size. The same applies when safety properties (such as fault tolerance or fail-safe) need to be verified in a new product development, in the design environment. If a bridging fault model replaces the simple stuck-at fault model, the fault list size easily becomes very large. If the product needs to comply to safety standards, such as EN298, these properties need to be verified in the presence of double faults, which explodes the fault list dimension. In this paper, a novel method is proposed to deal with this problem, based on fault sampling. A model to compute the confidence level that the globalfault coverage, FC, is within the interval [FCmin, 100%] is proposed. A case study, an ASIC for a safety-critical gas burner control system, is used to ascertain the usefulness of the proposed methodology.
引用
收藏
页码:216 / 224
页数:9
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