High sensitivity analysis of trace element-poor geological reference glasses by laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS)

Fifty-two trace elements in NIST SRM 614, 616 and MPI-DING BM90/21-G glass reference materials as well as in NIST SRM 612, USGS BCR2-G and other MPI-DING reference glasses (KL2-G, GOR132-G, GOR128-G, ATHO-G, T1-G, StHs6/80-G and ML3B-G) were determined by laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS). Accurate ultra-low trace element abundances in the NIST SRM 614, 616 and BM90/21-G reference glasses down to lower ng g(-1) levels were determined with relative standard deviations (RSD) of less than 10%. Limits of detection using He as carrier gas were up to two times lower than with Ar and were 0.004 to 0.12 mu g g(-1) for elements of lower mass numbers (amu < 85) and 0.002 to 0.06 mu g g(-1) for elements having amu 85. The measured concentrations generally agree within 15% with previous studies except for B in NIST SRM 614 and 616, which appears to be heterogeneously distributed, and Co, Zn, Go and Ag in NIST SRM 616 for which the existing data set is too small to evaluate the discrepancies. New values for As (0.593 mu g g(-1)), Ag (0.361 mu g g(-1)) and Cd (0.566 mu g g(-1)) in NIST SRM 614 and new values for No (94864 mu g g(-1)) and As (0.276 mu g g(-1)) in NIST SRM 616 are reported.