Nonlinear regression model of a low-g MEMS accelerometer

This paper proposes a nonlinear regression model of a microelectromechanical systems capacitive accelerometer, targeted to be used in tilt sensing and low-g motion-tracking applications. The proposed model for the accelerometer's deterministic errors includes common physical parameters used to rate an accelerometer: scale factor, bias, and misalignment. Simple experiments used to reveal the behavior and characteristics of these parameters are described. A phenomenological modeling method is used to establish mathematical representations of these parameters in relation to errors such as nonlinearity and cross-axis effect, without requiring a complete understanding of the underlying physics. Tilt and motion-sensing experiments show that the proposed model reduces sensing errors to a level close to the residual stochastic noise.