A Low-Energy and Area-Efficient Vaq-Based Switching Scheme with Capacitor-Splitting Structure for SAR ADCs

被引:7
作者
Huang, Linlin [1 ,2 ]
Zhang, Lizhen [1 ,2 ]
Chen, Minggang [1 ]
Li, Junhui [1 ,2 ]
Wu, Jianhui [1 ,2 ]
机构
[1] Southeast Univ, Natl ASIC Res Ctr, Nanjing 210096, Jiangsu, Peoples R China
[2] Southeast Univ, Jiangsu Prov Key Lab Sensor Network Technol, Nanjing 210096, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
SAR ADCs; Switching scheme; Capacitor-splitting; Low power; Area efficiency; Control logic complexity; HIGH-ACCURACY; REDUCTION;
D O I
10.1007/s00034-021-01666-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel energy-saving and area-efficient tri-level switching scheme is proposed for successive approximation register analog-to-digital converters (SAR ADCs). Different from most published tri-level switching schemes, a new third reference voltage V-aq which equals to 1/4 V-ref is applied to the proposed scheme. And benefiting from V-aq, the proposed scheme achieves 87.5% capacitor area reduction over the conventional scheme. Due to the capacitor-splitting structure and top-plate sampling, the switching energy is negative during the first three switching cycles, which means the capacitor arrays return energy back to the reference voltages and results in significant energy saving. For a 10-bit SAR ADC, the average switching energy of proposed scheme is only 5.3 CVref2, which realizes 99.61% energy saving compared with the conventional scheme. Moreover, the proposed scheme is of low control logic complexity since single-side switching is applied during the remaining switching cycles. Therefore, the proposed scheme achieves a good trade-off among energy saving, area efficiency and logic complexity. For a 10-bit SAR ADC, the simulated differential nonlinearity (DNL) and integral nonlinearity (INL) with 1% capacitor mismatch are 0.322 LSB and 0.321 LSB, respectively. Considering 0.3% reference voltage mismatch, the mean values of effective number of bits (ENOB), signal-to-noise-and-distortion ratio (SNDR) and spurious-free-dynamic-range (SFDR) are 9.77 bit, 60.57 dB and 75.43 dB, respectively, through 500 Monte Carlo simulations. To verify the feasibility of circuit implementation, transistor level simulation of a 0.6-V 10-bit 200-KS/s SAR ADC in 40-nm CMOS technology is performed. The ENOB, SNDR and SFDR of SAR ADC with 98.83-kHz Nyquist rate input are 9.66 bit, 59.90 dB and 71.98 dB, respectively.
引用
收藏
页码:4106 / 4126
页数:21
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