A manufacturing quality prediction model based on AdaBoost-LSTM with rough knowledge

被引:52
作者
Bai, Yun [1 ,2 ]
Xie, Jingjing [3 ]
Wang, Dongqiang [3 ]
Zhang, Wanjuan [1 ]
Li, Chuan [1 ]
机构
[1] Chongqing Technol & Business Univ, Sch Management Sci & Engn, Chongqing 400067, Peoples R China
[2] Univ Algarve, Fac Sci & Technol, Faro, Portugal
[3] Chongqing Acad Big Data, Chongqing 401123, Peoples R China
基金
中国国家自然科学基金;
关键词
Manufacturing quality; Prediction; Rough set; Long short-term memory; AdaBoost ensemble learning; REMAINING USEFUL LIFE; SET-THEORY; PRODUCT QUALITY; FEATURE-EXTRACTION; FAULT-DIAGNOSIS; TOOL WEAR; IDENTIFICATION; REGRESSION; MACHINE; OPTIMIZATION;
D O I
10.1016/j.cie.2021.107227
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Manufacturing quality prediction is one of the significant concerns in modern enterprise production management, which provides data support for reliability assessment and parameter optimization, thus improving the intelligent management level of enterprises and helping achieve high-quality products at lower costs. In this paper, an ensemble learning framework using rough knowledge is proposed for manufacturing quality prediction. The proposed model consists of three elements: (1) significant parameters in different production stages are selected based on attribute reduction and decision rule extraction of rough set theory (RS), (2) long short-term memory network (LSTM) is utilized for building the relationship between the significant parameters and manufacturing quality, and (3) the learning performance of the LSTM is reinforced by AdaBoost approach. To estimate the effectiveness of the proposed model, a competition dataset about manufacturing quality control is applied and six models are investigated. The comparison experiments show that the proposed model overwhelms all the comparison models in terms of root-mean-square error, threshold statistics and residuals analysis. In addition, the proposed model has statistically significant difference from all the comparative models. It is recommended from this work that the ensemble learning technique integrating the rough knowledge synchronously improves the sensitivity and regression capacity of the model.
引用
收藏
页数:10
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共 51 条
  • [1] A comparison of dimension reduction techniques for support vector machine modeling of multi-parameter manufacturing quality prediction
    Bai, Yun
    Sun, Zhenzhong
    Zeng, Bo
    Long, Jianyu
    Li, Lin
    de Oliveira, Jose Valente
    Li, Chuan
    [J]. JOURNAL OF INTELLIGENT MANUFACTURING, 2019, 30 (05) : 2245 - 2256
  • [2] Manufacturing Quality Prediction Using Intelligent Learning Approaches: A Comparative Study
    Bai, Yun
    Sun, Zhenzhong
    Deng, Jun
    Li, Lin
    Long, Jianyu
    Li, Chuan
    [J]. SUSTAINABILITY, 2018, 10 (01)
  • [3] Hybrid of Two Heuristic Optimizations with LSSVM to Predict Refractive Index as Asphaltene Stability Identifier
    Chamkalani, Ali
    Chamkalani, Reza
    Mohammadi, Amir H.
    [J]. JOURNAL OF DISPERSION SCIENCE AND TECHNOLOGY, 2014, 35 (08) : 1041 - 1050
  • [5] Robust modelling and prediction of thermally induced positional error based on grey rough set theory and neural networks
    Cheng, Qiang
    Qi, Zhuo
    Zhang, Guojun
    Zhao, Yongsheng
    Sun, Bingwei
    Gu, Peihua
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2016, 83 (5-8) : 753 - 764
  • [6] Multi-Scale Fuzzy Inference System for Influent Characteristic Prediction of Wastewater Treatment
    Cheng, Zhiwei
    Li, Xuejiao
    Bai, Yun
    Li, Chuan
    [J]. CLEAN-SOIL AIR WATER, 2018, 46 (07)
  • [7] A Deep Regression Model with Low-Dimensional Feature Extraction for Multi-Parameter Manufacturing Quality Prediction
    Deng, Jun
    Bai, Yun
    Li, Chuan
    [J]. APPLIED SCIENCES-BASEL, 2020, 10 (07):
  • [8] Evaluation of simple performance measures for tuning SVM hyperparameters
    Duan, K
    Keerthi, SS
    Poo, AN
    [J]. NEUROCOMPUTING, 2003, 51 : 41 - 59
  • [9] Automatic recognition system of welding seam type based on SVM method
    Fan, Junfeng
    Jing, Fengshui
    Fang, Zaojun
    Tan, Min
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2017, 92 (1-4) : 989 - 999
  • [10] Wafer fault detection and key step identification for semiconductor manufacturing using principal component analysis, AdaBoost and decision tree
    Fan, Shu-Kai S.
    Lin, Shou-Chih
    Tsai, Pei-Fang
    [J]. JOURNAL OF INDUSTRIAL AND PRODUCTION ENGINEERING, 2016, 33 (03) : 151 - 168