Influence of separate confinement heterostructures on the effective carrier recombination coefficient in quantum well laser structures

被引:3
作者
Yamamoto, T
Odagawa, T
Tanaka, K
Ogita, S
机构
[1] Fujitsu Laboratories Ltd., Atsugi 243-01
[2] Fujitsu Limited, Nakahara-ku, Kawasaki 211
关键词
D O I
10.1063/1.119960
中图分类号
O59 [应用物理学];
学科分类号
摘要
We analyzed the carrier recombination coefficient of quantum well laser structures by combining two-level ambipolar rate equations and a carrier diffusion equation for the separate confinement heterostructure (SCH) layer. We derived a new analytical expression for the effective carrier recombination coefficient (B-eff) in quantum well laser structures. From our analysis, we found out that the dominant factor that determines B-eff if is not the diffusion across the SCH layer but the ratio of confined carriers in the well to the total carriers in both the well and the SCH layers. Our new expression well explained the measured results of 1.3 mu m strained-layer quantum well lasers with SCH layers of different thicknesses. (C) 1997 American Institute of Physics.
引用
收藏
页码:1543 / 1545
页数:3
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