Controlled dephasing of electrons via a phase sensitive detector

被引：104

作者：

Sprinzak, D ^{[1
]}

Buks, E ^{[1
]}

Heiblum, M ^{[1
]}

Shtrikman, H ^{[1
]}

机构：

[1] Weizmann Inst Sci, Dept Condensed Matter Phys, Braun Ctr Submicron Res, IL-76100 Rehovot, Israel

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 25期

关键词：

D O I：

10.1103/PhysRevLett.84.5820

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We demonstrate a controlled dephasing experiment via exploiting a unique entangled interferometer-detector system, realized in an electronic mesoscopic structure. We study the dephasing process both from the path which path information available in the detector and, alternatively, from the direct effect of the detector on the interferometer. Detection is possible only due to an induced phase change in the detector. Even though this phase change cannot actually be measured, strong dephasing of the interferometer took place. The intricate role of detector's noise and coherency are investigated.

引用

页码：5820 / 5823

页数：4

共 14 条

[1] Dephasing and the orthogonality catastrophe in tunneling through a quantum dot: The ''Which Path?'' interferometer [J].