Determination of nonlinear absorption and refraction by single Z-scan method

被引:295
作者
Yin, M [1 ]
Li, HP
Tang, SH
Ji, W
机构
[1] Natl Univ Singapore, Dept Phys, Singapore 119260, Singapore
[2] Nanyang Technol Univ, Sch EEE, Photon Lab, Singapore 639789, Singapore
来源
APPLIED PHYSICS B-LASERS AND OPTICS | 2000年 / 70卷 / 04期
关键词
D O I
10.1007/s003400050866
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z = 0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.
引用
收藏
页码:587 / 591
页数:5
相关论文
共 9 条
  • [1] Born M., 1986, PRINCIPLES OPTICS
  • [2] FEMTOSECOND MEASUREMENT OF NONLINEAR ABSORPTION AND REFRACTION IN CDS, ZNSE, AND ZNS
    KRAUSS, TD
    WISE, FW
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (14) : 1739 - 1741
  • [3] 2-PHOTON ABSORPTION AS A LIMITATION TO ALL-OPTICAL SWITCHING
    MIZRAHI, V
    DELONG, KW
    STEGEMAN, GI
    SAIFI, MA
    ANDREJCO, MJ
    [J]. OPTICS LETTERS, 1989, 14 (20) : 1140 - 1142
  • [4] DETERMINATION OF BOUND-ELECTRONIC AND FREE-CARRIER NONLINEARITIES IN ZNSE, GAAS, CDTE, AND ZNTE
    SAID, AA
    SHEIKBAHAE, M
    HAGAN, DJ
    WEI, TH
    WANG, J
    YOUNG, J
    VANSTRYLAND, EW
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1992, 9 (03) : 405 - 414
  • [5] SENSITIVE MEASUREMENT OF OPTICAL NONLINEARITIES USING A SINGLE BEAM
    SHEIKBAHAE, M
    SAID, AA
    WEI, TH
    HAGAN, DJ
    VANSTRYLAND, EW
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (04) : 760 - 769
  • [6] DISPERSION OF BOUND ELECTRONIC NONLINEAR REFRACTION IN SOLIDS
    SHEIKBAHAE, M
    HUTCHINGS, DC
    HAGAN, DJ
    VANSTRYLAND, EW
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1991, 27 (06) : 1296 - 1309
  • [7] STEGEMAN GI, 1988, J LIGHTWAVE TECHNOL, V6, P953
  • [8] TIME-RESOLVED Z-SCAN MEASUREMENTS OF OPTICAL NONLINEARITIES
    WANG, J
    SHEIKBAHAE, M
    SAID, AA
    HAGAN, DJ
    VANSTRYLAND, EW
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1994, 11 (06) : 1009 - 1017
  • [9] Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique
    Zhang, X
    Fang, H
    Tang, S
    Ji, W
    [J]. APPLIED PHYSICS B-LASERS AND OPTICS, 1997, 65 (4-5): : 549 - 554