A Novel Scale Up Model for Prediction of Pharmaceutical Film Coating Process Parameters
被引:3
作者:
Suzuki, Yasuhiro
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机构:
Daiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, JapanDaiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, Japan
Suzuki, Yasuhiro
[1
]
Suzuki, Tatsuya
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机构:
Daiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, JapanDaiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, Japan
Suzuki, Tatsuya
[1
]
Minami, Hidemi
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机构:
Daiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, JapanDaiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, Japan
Minami, Hidemi
[1
]
Terada, Katsuhide
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机构:
Toho Univ, Fac Pharmaceut Sci, 2-2-1 Miyama, Funabashi, Chiba 2748510, JapanDaiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, Japan
Terada, Katsuhide
[2
]
机构:
[1] Daiichi Sankyo Co Ltd, Formulat Technol Res Labs, 1-12-1 Shinomiya, Hiratsuka, Kanagawa 2540014, Japan
[2] Toho Univ, Fac Pharmaceut Sci, 2-2-1 Miyama, Funabashi, Chiba 2748510, Japan
pan coater;
exhaust air relative humidity index (EHI);
scale up;
drying ability;
atmospheric air;
tablet water content;
PROCESS ANALYTICAL TECHNOLOGY;
TABLETS;
SPECTROSCOPY;
THICKNESS;
MASS;
D O I:
10.1248/cpb.c15-00644
中图分类号:
R914 [药物化学];
学科分类号:
100701 ;
摘要:
In the pharmaceutical tablet film coating process, we clarified that a difference in exhaust air relative humidity can be used to detect differences in process parameters values, the relative humidity of exhaust air was different under different atmospheric air humidity conditions even though all setting values of the manufacturing process parameters were the same, and the water content of tablets was correlated with the exhaust air relative humidity. Based on this experimental data, the exhaust air relative humidity index (EHI), which is an empirical equation that includes as functional parameters the pan coater type, heated air flow rate, spray rate of coating suspension, saturated water vapor pressure at heated air temperature, and partial water vapor pressure at atmospheric air pressure, was developed. The predictive values of exhaust relative humidity using EHI were in good correlation with the experimental data (correlation coefficient of 0.966) in all datasets. EHI was verified using the date of seven different drug products of different manufacturing scales. The EHI model will support formulation researchers by enabling them to set film coating process parameters when the batch size or pan coater type changes, and without the time and expense of further extensive testing.
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页码:215 / 221
页数:7
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am Ende M. T., 2005, PHARM DEV TECHNOL, V1, P47
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Technol SERVIER, F-45000 Orleans, France
Univ Toulouse, RAPSODEE FRE CNRS 3213, F-81013 Albi, France
Univ Paris Sud, EA 4041, Grp Chim Analyt Paris Sud, Fac Pharm,IPSIT,IFR 141, F-92296 Chatenay Malabry, FranceTechnol SERVIER, F-45000 Orleans, France
Gendre, Claire
Genty, Muriel
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Genty, Muriel
Boiret, Mathieu
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
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Julien, Marc
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Julien, Marc
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
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Baron, Michel
Chaminade, Pierre
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Univ Paris Sud, EA 4041, Grp Chim Analyt Paris Sud, Fac Pharm,IPSIT,IFR 141, F-92296 Chatenay Malabry, FranceTechnol SERVIER, F-45000 Orleans, France
Chaminade, Pierre
Pean, Jean Manuel
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
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Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USAPurdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
Kumar, Rahul
Wassgren, Carl
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Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
Purdue Univ, Dept Ind & Phys Pharm Courtesy, W Lafayette, IN 47907 USAPurdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
机构:
Technol SERVIER, F-45000 Orleans, France
Univ Toulouse, RAPSODEE FRE CNRS 3213, F-81013 Albi, France
Univ Paris Sud, EA 4041, Grp Chim Analyt Paris Sud, Fac Pharm,IPSIT,IFR 141, F-92296 Chatenay Malabry, FranceTechnol SERVIER, F-45000 Orleans, France
Gendre, Claire
Genty, Muriel
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Genty, Muriel
Boiret, Mathieu
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Boiret, Mathieu
Julien, Marc
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Julien, Marc
Meunier, Loic
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
Meunier, Loic
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机构:
Lecoq, Olivier
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Baron, Michel
Chaminade, Pierre
论文数: 0引用数: 0
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机构:
Univ Paris Sud, EA 4041, Grp Chim Analyt Paris Sud, Fac Pharm,IPSIT,IFR 141, F-92296 Chatenay Malabry, FranceTechnol SERVIER, F-45000 Orleans, France
Chaminade, Pierre
Pean, Jean Manuel
论文数: 0引用数: 0
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Technol SERVIER, F-45000 Orleans, FranceTechnol SERVIER, F-45000 Orleans, France
机构:
Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USAPurdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
Kumar, Rahul
Wassgren, Carl
论文数: 0引用数: 0
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Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
Purdue Univ, Dept Ind & Phys Pharm Courtesy, W Lafayette, IN 47907 USAPurdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA