Robust extraction of spatial correlation

被引:104
作者
Xiong, Jinjun [1 ]
Zolotov, Vladimir
He, Lei
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90096 USA
基金
美国国家科学基金会;
关键词
extraction; modeling; nearest correlation matrix; process variation; spatial correlation; valid spatial correlation function;
D O I
10.1109/TCAD.2006.884403
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The increased variability of process parameters makes it important yet challenging to extract the statistical characteristics and spatial correlation of process variation. Recent progress in statistical static-timing analysis also makes the extraction important for modern chip designs. Existing approaches extract either only a deterministic component of spatial variation or these approaches do not consider the actual difficulties in computing a valid spatial-correlation function, ignoring the fact that not every function and matrix can be used to describe the spatial correlation. Applying mathematical theories from random fields and convex analysis' we develop: 1) a robust technique to extract a valid spatial-correlation function by solving a constrained nonlinear optimization problem and 2) a robust technique to extract a valid spatial-correlation matrix by employing a modified alternative-projection algorithm. Our novel techniques guarantee to extract a valid spatial-correlation function and matrix from measurement data, even if those measurements are affected by unavoidable random noises. Experiment results, obtained from data generated by a Monte Carlo model, confirm the accuracy and robustness of our techniques and show that we are able to recover the correlation function and matrix with very high accuracy even in the presence of significant random noises.
引用
收藏
页码:619 / 631
页数:13
相关论文
共 28 条
[1]  
Agarwal A, 2003, ICCAD-2003: IEEE/ACM DIGEST OF TECHNICAL PAPERS, P900
[2]  
[Anonymous], 2001, Matrix Analysis and Applied Linear Algebra
[3]   VARIOGRAM MODELS MUST BE POSITIVE-DEFINITE [J].
ARMSTRONG, M ;
JABIN, R .
JOURNAL OF THE INTERNATIONAL ASSOCIATION FOR MATHEMATICAL GEOLOGY, 1981, 13 (05) :455-459
[4]   Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [J].
Bowman, KA ;
Duvall, SG ;
Meindl, JD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (02) :183-190
[5]   Least-squares covariance matrix adjustment [J].
Boyd, S ;
Xiao, L .
SIAM JOURNAL ON MATRIX ANALYSIS AND APPLICATIONS, 2005, 27 (02) :532-546
[6]  
Bras R. L., 1985, RANDOM FUNCTIONS HYD
[7]  
Chang HL, 2003, ICCAD-2003: IEEE/ACM DIGEST OF TECHNICAL PAPERS, P621
[8]   Analysis of the impact of proximity correction algorithms on circuit performance [J].
Chen, L ;
Milor, LS ;
Ouyang, CH ;
Maly, W ;
Peng, YK .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1999, 12 (03) :313-322
[9]   An interior trust region approach for nonlinear minimization subject to bounds [J].
Coleman, TF ;
Li, YY .
SIAM JOURNAL ON OPTIMIZATION, 1996, 6 (02) :418-445
[10]   A unified statistical model for inter-die and intra-die process variation [J].
Doh, JS ;
Kim, DW ;
Lee, SH ;
Lee, JB ;
Park, YK ;
Yoo, MH ;
Kong, JT .
SISPAD: 2005 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2005, :131-134