Production of x-ray multilayer coatings by plasma sputtering

被引:0
作者
Morawe, C [1 ]
Peffen, JC [1 ]
Ziegler, E [1 ]
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源
VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 1999年 / 54卷 / 294期
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D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray optical elements have been coated with multilayers using a DECR aArgon plasma sputtering technique. In a number of applications, e.g. beam focusing, a lateral gradient of the multilateral period is required. This is obtained by scanning a set of sputter targets at controlled speed with respect to the stationary mirror substrate. The target velocities are inferred from a model that accounts for the plasma ion density and the spatial flux distribution above each target. Thickness profiles have been produced over 300 mm by 50 mm with a precision better than 1%. Recent results on the deposition of M/B4C multilayers, where M = Cr, Ni, Mo, Ru, and W, are presented.
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页码:467 / 472
页数:6
相关论文
共 7 条
[1]   DISTRIBUTED ELECTRON-CYCLOTRON RESONANCE IN SILICON PROCESSING - EPITAXY AND ETCHING [J].
BURKE, RR ;
PELLETIER, J ;
POMOT, C ;
VALLIER, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :2931-2938
[2]   INTERFACIAL ROUGHNESS OF SPUTTERED MULTILAYERS - NB/SI [J].
FULLERTON, EE ;
PEARSON, J ;
SOWERS, CH ;
BADER, SD ;
WU, XZ ;
SINHA, SK .
PHYSICAL REVIEW B, 1993, 48 (23) :17432-17444
[3]  
HOGHOJ P, 1994, THESIS U COPENHAGEN
[4]  
JOENSEN KD, 1992, SPIE, V1736, P239
[5]   Focusing optics for high-energy X-ray diffraction [J].
Lienert, U ;
Schulze, C ;
Honkimaki, V ;
Tschentscher, T ;
Garbe, S ;
Hignette, O ;
Horsewell, A ;
Lingham, M ;
Poulsen, HF ;
Thomsen, NB ;
Ziegler, E .
JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 :226-231
[6]   MICROWAVE MULTIPOLAR PLASMAS EXCITED BY DISTRIBUTED ELECTRON-CYCLOTRON RESONANCE - CONCEPT AND PERFORMANCE [J].
PICHOT, M ;
DURANDET, A ;
PELLETIER, J ;
ARNAL, Y ;
VALLIER, L .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (07) :1072-1075
[7]  
ZIEGLER E, 1992, PHYS XRAY MULT STRUC, V7, P16